Smart Examination System

Authors

  • B. Chaitra Student, Department of Electronics and Communication Engineering, Srinivas Institute of Technology, Mangalore, India
  • A. R. Anusha Student, Department of Electronics and Communication Engineering, Srinivas Institute of Technology, Mangalore, India
  • Nishmitha Student, Department of Electronics and Communication Engineering, Srinivas Institute of Technology, Mangalore, India
  • C. Ardra Student, Department of Electronics and Communication Engineering, Srinivas Institute of Technology, Mangalore, India

Keywords:

Attendance management system, Face detection, Image processing, Local binary pattern

Abstract

The Smart Examination System is developed for making the Examination process easier and efficient. Now a day’s 98% of the colleges conducting the exams in the traditional way. This consumes lots of time and paper work. This Project is to modernize the traditional way of conducting the exams. The project simplifies the attendance management system means attendance will be generated automatically during the examination. This process reduces the duty of the invigilator and the office staffs.

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Published

05-08-2020

Issue

Vol. 3 No. 8 (2020)

Section

Articles

License

Copyright (c) 2020 B. Chaitra, A. R. Anusha, Nishmitha, C. Ardra

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
B. Chaitra, A. R. Anusha, Nishmitha, and C. Ardra, “Smart Examination System”, IJRESM, vol. 3, no. 8, pp. 61–64, Aug. 2020, Accessed: Apr. 18, 2024. [Online]. Available: https://journal.ijresm.com/index.php/ijresm/article/view/125