NANDINI, D.; ABHISHEK, M.; ADITHYA, M.; ANIRUDHA, G.; REDDY, V. Charmyka. Deep Trace: Unravelling Deepfakes Through LSTM Analysis. International Journal of Research in Engineering, Science and Management, [S. l.], v. 7, n. 4, p. 82–84, 2024. DOI: 10.5281/zenodo.10970046. Disponível em: https://journal.ijresm.com/index.php/ijresm/article/view/2996.. Acesso em: 22 jul. 2024.